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Fourier Optics | Physics - Wyatt's Notes

10.1 Fraunhofer Diffraction as a Fourier Transform

Section titled “10.1 Fraunhofer Diffraction as a Fourier Transform”

The Fraunhofer diffraction pattern of an aperture with transmittance function t(x,y)t(x, y) illuminated by a plane wave is proportional to the 2D Fourier transform of the aperture function:

E(u,v)t(x,y)e2πi(ux+vy)dxdy=F{t(x,y)}(u,v)E(u, v) \propto \iint t(x,y)\, e^{-2\pi i(ux + vy)}\, dx\, dy = \mathcal{F}\{t(x,y)\}(u, v)

Where u=sinθx/λu = \sin\theta_x/\lambda and v=sinθy/λv = \sin\theta_y/\lambda are the spatial frequencies.

Theorem 10.1. The intensity in the Fraunhofer diffraction pattern is

I(u,v)=I0t~(u,v)2I(u,v) = I_0\,|\tilde{t}(u,v)|^2

Where t~(u,v)=F{t(x,y)}(u,v)\tilde{t}(u,v) = \mathcal{F}\{t(x,y)\}(u,v) is the Fourier transform of the aperture function.

Proof. The Huygens-Fresnel principle in the far field gives:

E(x",y)=eikriλrt(x,y)eik(xx+yy)/rdxdyE(x",y') = \frac{e^{ikr}}{i\lambda r}\iint t(x,y)\, e^{-ik(xx' + yy')/r}\, dx\, dy

In the far field, rDr \approx D and the phase factor eik(xx+yy)/re^{-ik(xx' + yy')/r} is exactly the kernel of the Fourier transform. \blacksquare

Theorem 10.2 (Convolution theorem). If an aperture function is the convolution t=t1t2t = t_1 * t_2The diffraction pattern is the product of the individual diffraction patterns:

F{t1t2}=F{t1}F{t2}\mathcal{F}\{t_1 * t_2\} = \mathcal{F}\{t_1\} \cdot \mathcal{F}\{t_2\}

Corollary. If an aperture is the product t=t1t2t = t_1 \cdot t_2The diffraction pattern is the convolution of the individual patterns:

F{t1t2}=F{t1}F{t2}\mathcal{F}\{t_1 \cdot t_2\} = \mathcal{F}\{t_1\} * \mathcal{F}\{t_2\}

10.3 Worked Example: Diffraction Grating via Fourier Transform

Section titled “10.3 Worked Example: Diffraction Grating via Fourier Transform”

Problem. Use the Fourier transform to derive the intensity pattern of a grating with NN slits of width aa and spacing dd.

Solution

The transmittance of a single slit centred at x=0x = 0 is tslit(x)=rect(x/a)t_{\mathrm{slit}(x) = \mathrm{rect}(x/a)}. The full grating is NN slits:

t(x)=n=0N1tslit(xnd)=tslit(x)n=0N1δ(xnd)t(x) = \sum_{n=0}^{N-1} t_{\mathrm{slit}(x - nd) = t_{\mathrm{slit}(x) * \sum_{n=0}^{N-1} \delta(x - nd)}}

The Fourier transform is:

t~(u)=F{tslit}F{n=0N1δ(xnd)}\tilde{t}(u) = \mathcal{F}\{t_{\mathrm{slit}\} \cdot \mathcal{F}\left\{\sum_{n=0}^{N-1}\delta(x - nd)\right\}}

=asinc(πau)n=0N1e2πindu=asinc(πau)sin(Nπdu)sin(πdu)= a\,\mathrm{sinc}(\pi a u) \cdot \sum_{n=0}^{N-1} e^{-2\pi i n d u} = a\,\mathrm{sinc}(\pi a u) \cdot \frac{\sin(N\pi d u)}{\sin(\pi d u)}

The intensity is:

I(u)=I0a2sinc2(πau)sin2(Nπdu)sin2(πdu)I(u) = I_0\,a^2\,\mathrm{sinc}^2(\pi a u)\,\frac{\sin^2(N\pi d u)}{\sin^2(\pi d u)}

The first factor is the single-slit envelope; the second is the NN-slit interference pattern. Principal maxima occur at du=mdu = m (integer mm), giving the grating equation dsinθ=mλd\sin\theta = m\lambda.

\blacksquare

10.4 Worked Example: Circular Aperture and the Airy Pattern

Section titled “10.4 Worked Example: Circular Aperture and the Airy Pattern”

Problem. Compute the Fraunhofer diffraction pattern of a circular aperture of radius aa.

Solution

The aperture function is t(r)=1t(r) = 1 for rar \leq a and t(r)=0t(r) = 0 for r>ar > a. By circular symmetry, the Fourier transform in polar coordinates is:

t~(q)=2π0aJ0(2πqr)rdr\tilde{t}(q) = 2\pi\int_0^a J_0(2\pi q r)\, r\, dr

Where J0J_0 is the Bessel function of the first kind and q=sinθ/λq = \sin\theta/\lambda is the radial spatial frequency. Using the identity:

0aJ0(2πqr)rdr=a2πqJ1(2πqa)\int_0^a J_0(2\pi q r)\, r\, dr = \frac{a}{2\pi q}J_1(2\pi q a)

t~(q)=πa22J1(α)α\tilde{t}(q) = \pi a^2 \cdot \frac{2J_1(\alpha)}{\alpha}

Where α=2πaq=2πasinθ/λ\alpha = 2\pi a q = 2\pi a\sin\theta/\lambda. The intensity is:

I(θ)=I0(2J1(α)α)2I(\theta) = I_0\left(\frac{2J_1(\alpha)}{\alpha}\right)^2

This is the Airy pattern. The first zero occurs at α=3.832\alpha = 3.832Giving the angular radius of the first dark ring:

sinθ1=1.22λd\sin\theta_1 = 1.22\,\frac{\lambda}{d}

Where d=2ad = 2a is the diameter.

\blacksquare

  • Rayleigh criterion: Two point sources are just resolved when the centre of the Airy disc of one coincides with the first dark ring of the other, giving the minimum resolvable angle θmin=1.22λ/d\theta_{\min} = 1.22\lambda/d.
  • Fourier scaling property: If t(x,y)t(x,y) is scaled by aa, i.e., t(x/a,y/a)t(x/a, y/a), then t~(u,v)\tilde{t}(u,v) scales as a2t~(au,av)|a|^2\tilde{t}(au, av). A larger aperture produces a narrower diffraction pattern.
  • Parseval’s theorem: t(x,y)2dxdy=t~(u,v)2dudv\iint |t(x,y)|^2\,dx\,dy = \iint |\tilde{t}(u,v)|^2\,du\,dv. The total power in the aperture equals the total power in the diffraction pattern.
  • Uncertainty principle analogy: A narrow aperture (small Δx\Delta x) produces a wide diffraction pattern (large Δu\Delta u), and vice versa. Quantitatively, ΔxΔu1\Delta x \cdot \Delta u \gtrsim 1.
  • Confusing Fraunhofer with Fresnel diffraction: Fraunhofer diffraction requires the far-field condition Da2/λD \gg a^2/\lambda. At shorter distances, Fresnel (near-field) diffraction must be used, and the pattern is not a simple Fourier transform.
  • Forgetting the intensity is the squared modulus: The diffraction pattern is I(u,v)=I0t~(u,v)2I(u,v) = I_0|\tilde{t}(u,v)|^2, not t~(u,v)\tilde{t}(u,v). Phase information is lost in the intensity measurement.
  • Neglecting the obliquity factor: The Huygens-Fresnel principle includes a directional cosine factor. For small angles this is approximately constant, but at large angles it modifies the pattern.
  • Assuming the Fourier transform of a real function is real: Even if t(x,y)t(x,y) is real and non-negative, t~(u,v)\tilde{t}(u,v) is generally complex. The phase of t~\tilde{t} carries information about the spatial structure of the aperture.
  • Telescope resolution: The Airy pattern sets the fundamental resolution limit of any circular-aperture optical system. The diameter of the primary mirror determines the smallest detail that can be resolved.
  • Spectrometre design: A diffraction grating disperses light according to the grating equation dsinθ=mλd\sin\theta = m\lambda. The resolving power R=mNR = mN depends on the order mm and the number of illuminated slits NN.
  • Spatial filtering: By placing masks in the Fourier plane (at the focal length of a lens), specific spatial frequencies can be blocked or attenuated. This enables edge enhancement, noise removal, and pattern recognition.
  • Holography: A hologram records both the amplitude and phase of the diffracted field. Reconstruction involves illuminating the hologram, which acts as a complex transmittance function whose Fourier transform reproduces the original wavefront.

10.8 Worked Example: Double-Slit via Fourier Transform

Section titled “10.8 Worked Example: Double-Slit via Fourier Transform”

Problem. Use the convolution theorem to derive the double-slit diffraction pattern.

The aperture is the product of a double-slit function t1(x)=rect((xd/2)/a)+rect((x+d/2)/a)t_1(x) = \mathrm{rect}((x - d/2)/a) + \mathrm{rect}((x + d/2)/a) and a wide rectangular window. However, it is simpler to view the double slit as a single slit convolved with two delta functions:

t(x)=rect(x/a)[δ(xd/2)+δ(x+d/2)]t(x) = \mathrm{rect}(x/a) \cdot [\delta(x - d/2) + \delta(x + d/2)]

Wait, the double slit is a product (two slits cut from an opaque screen). The transmittance is:

t(x)=[rect((xd/2)/a)+rect((x+d/2)/a)]t(x) = [\mathrm{rect}((x - d/2)/a) + \mathrm{rect}((x + d/2)/a)]

The Fourier transform is:

t~(u)=asinc(πau)eiπdu+asinc(πau)eiπdu=2asinc(πau)cos(πdu)\tilde{t}(u) = a\,\mathrm{sinc}(\pi a u)\,e^{-i\pi d u} + a\,\mathrm{sinc}(\pi a u)\,e^{i\pi d u} = 2a\,\mathrm{sinc}(\pi a u)\cos(\pi d u)

The intensity is:

I(u)=4I0a2sinc2(πau)cos2(πdu)I(u) = 4I_0 a^2\,\mathrm{sinc}^2(\pi a u)\cos^2(\pi d u)

The cos2\cos^2 factor produces the double-slit interference fringes with spacing Δu=1/d\Delta u = 1/d, and the sinc2^2 factor provides the single-slit envelope.

\blacksquare

Problem. Find the Fraunhofer diffraction pattern of a rectangular aperture of width aa and height bb.

The aperture function is separable: t(x,y)=rect(x/a)rect(y/b)t(x,y) = \mathrm{rect}(x/a)\,\mathrm{rect}(y/b). By the separability of the 2D Fourier transform:

t~(u,v)=F{rect(x/a)}(u)F{rect(y/b)}(v)=absinc(πau)sinc(πbv)\tilde{t}(u,v) = \mathcal{F}\{\mathrm{rect}(x/a)\}(u) \cdot \mathcal{F}\{\mathrm{rect}(y/b)\}(v) = ab\,\mathrm{sinc}(\pi a u)\,\mathrm{sinc}(\pi b v)

The intensity is:

I(u,v)=I0a2b2sinc2(πau)sinc2(πbv)I(u,v) = I_0\,a^2 b^2\,\mathrm{sinc}^2(\pi a u)\,\mathrm{sinc}^2(\pi b v)

The pattern is a product of two sinc2^2 functions. The first zero along uu occurs at u=1/au = 1/a (angular position sinθx=λ/a\sin\theta_x = \lambda/a), and along vv at v=1/bv = 1/b (sinθy=λ/b\sin\theta_y = \lambda/b). A wider aperture produces a narrower diffraction pattern in that direction.

  • Diffraction: Provides the physical foundation for Fraunhofer diffraction through the Huygens-Fresnel principle and Kirchhoff integral.
  • Fourier Optics: Develops the 4f imaging system, optical transfer function, and spatial filtering applications that build on the Fourier transform framework.
  • Coherence: The coherence properties of the source determine whether the Fourier transform relationship between aperture and far-field pattern is valid.
flowchart TD
A[14_Fourier Optics 10] --> B[Key Concepts]
A --> C[Core Principles]
A --> D[Practical Applications]
B --> E[Fundamental definitions]
C --> F[Design patterns]
D --> G[Real-world usage]

Fourier optics reveals that diffraction is fundamentally a frequency decomposition. When light passes through an aperture, the far-field pattern is the spatial frequency content of that aperture shape. A narrow slit has broad frequency content, producing a wide diffraction pattern. The convolution theorem explains why grating patterns combine: multiplying apertures convolves their patterns. This is why a double-slit produces interference fringes modulated by the single-slit envelope. The lens performs a physical Fourier transform, converting spatial information into angular information at its focal plane.

This section provides detailed coverage of advanced concepts, including full derivations, proofs, and extended examples.

Complete mathematical derivations and proofs are provided where appropriate. Each step is explained to ensure understanding of the underlying reasoning.

Advanced examples demonstrate the application of concepts to complex problems. These examples go beyond standard exam questions to develop deeper understanding.

This material connects to current research and advanced applications in the field. Understanding these connections provides context for the study material.

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