When two or more waves overlap, the resultant displacement is the sum of the individual displacements. For two coherent waves with amplitudes E1 and E2:
Two slits separated by distance d are illuminated by coherent light of wavelength λ. The Screen is at distance L≫d.
Condition for bright fringes (constructive interference):
dsinθ=mλ,m=0,±1,±2,…
Condition for dark fringes (destructive interference):
dsinθ=(m+21)λ,m=0,±1,±2,…
Derivation. The path difference between the two slits is Δ=dsinθ. Constructive Interference occurs when Δ=mλ (phase difference 2mπ), and destructive when Δ=(m+1/2)λ (phase difference (2m+1)π). ■
The fringe spacing on the screen:
Δy=dλL
Worked Example: Double-slit fringe calculation
Problem. In a Young”s double-slit experiment, light of wavelength λ=550 nm passes Through slits separated by d=0.10 mm onto a screen at L=2.0 m. Find (a) the fringe spacing, (b) the angular position of the third bright fringe, and (c) the total number of bright fringes Visible within the central diffraction maximum (slit width a=0.020 mm).
Solution.
(a) Δy=λL/d=(550×10−9)(2.0)/(0.10×10−3)=11.0×10−3 m =11.0 mm.
(c) The diffraction envelope has its first minimum at sinθ=λ/a=550/20=27.5×10−3 Corresponding to interference order m=dsinθ/λ=(d/a)=0.10/0.020=5. Missing orders at m=±5,±10,…. Visible bright fringes: m=0,±1,±2,±3,±4 Giving 9 bright fringes within the central maximum.
Light reflecting from a thin film of thickness t and refractive index n undergoes interference Between the wave reflected from the top surface and the wave reflected from the bottom surface.
Path difference:2ntcosθt where θt is the angle of refraction inside the film.
A phase shift of π occurs upon reflection from a medium of higher refractive index. The condition For constructive interference (bright reflection) is:
Mistake 1: Confusing path difference with phase difference Path difference Δ and phase difference Δϕ are related by Δϕ=2πΔ/λ, not Δϕ=Δ/λ. A path difference of one wavelength corresponds to a phase difference of 2π, not 1. Students often drop the factor of 2π when converting between the two, leading to incorrect fringe conditions.
Mistake 2: Forgetting phase shifts upon reflection in thin-film interference When light reflects from a medium with higher refractive index, it undergoes a π phase shift. This changes the conditions for constructive and destructive interference. Forgetting this phase shift leads to predicting bright fringes where dark fringes appear (or vice versa). Always count the total number of π shifts before applying the interference conditions.
Mistake 3: Assuming interference requires two separate sources Interference can occur with a single source split and recombined (as in Young’s double slit or a Michelson interferometer). The key requirement is coherence, not separate sources. Even with two independent sources, interference is only observable if the sources are coherent (same frequency and fixed phase relationship). Thermal light sources are incoherent and do not produce stable interference patterns.